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| Number | Title | Issue Date |
| 8044678 | Device for simulating rectified constant impedance load and method thereof The device for simulating a rectified constant impedance load provide by the present invention is to test a power product and comprises an analog-digital converter, a digital signal processor, a digital-analog converter, and an active electrical load module in order... | 10/25/2011 |
| 7933732 | Electronic load device for power supply product to be tested and method for regulating bandwidth thereof An electronic load device provided for testing an OT (power supply to be tested) and the working bandwidth is regulated and set according to the output impedance of the OT. The electronic load device comprises a CPU, an impedance-bandwidth table, a voltage-current m... | 04/26/2011 |
| 7626688 | Optical measuring system with a high-speed optical sensing device enabling to sense luminous intensity and chromaticity A high-speed optical sensing device is provided in the present invention. The high-speed optical sensing device has an optical detector, a lens set, and a beam splitter. The optical detector is utilized for detecting luminous intensity. The lens set is utilized for ... | 12/01/2009 |
| 7626403 | Photosensor testing device with built-in light source and tester provided with said device The present invention provides a photosensor testing device with a built-in light source and a tester provided with said device, which has a base and an upper cover disposed above the base, characterized in that the upper cover is equipped with at least one light em... | 12/01/2009 |
| 7580590 | Optical image system surface resolution calibration method An optical image system surface resolution calibration method is provided herein, which utilizes a calibration standard and an image sensor device. The surface of the calibration standard is provided with a plurality of interleaving bright lines and dark lines, the ... | 08/25/2009 |
| 7545158 | Method for testing system-in-package devices A method for testing System-In-Package (SIP) devices each having a plurality of electrical contacts is described. The method and apparatus utilizes industry standard JEDEC trays and tests at least a predetermined portion of all devices in such trays at the same time... | 06/09/2009 |
| 7518357 | Test circuits of an apparatus for testing micro SD devices Apparatus for testing micro SD devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time. The apparatus comprises a test hive comprising: a plurality of... | 04/14/2009 |
| 7518356 | Apparatus for testing system-in-package devices Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical contacts is described. The apparatus comprises a JEDEC standard tray receiving apparatus comprising a plurality of tray aligners to align the tray into a predetermined positi... | 04/14/2009 |
| 7472042 | Surface profile measuring method A surface profile measuring method using a broad bandwidth light source illuminating a sample surface and a reference surface through a splitter is provided. By changing a distance between the sample surface and the reference surface with a constant step, an interfe... | 12/30/2008 |
| 7443190 | Method for testing micro SD devices using each test circuits A method for testing micro SD devices each having a plurality of electrical leads is described. The method utilizes industry standard JEDEC trays and tests at least a predetermined portion of the devices in such trays at the same time. The method of the illustrative... | 10/28/2008 |
| 7423764 | Integrated interference scanning method An integrated interference scanning method, mainly used to integrate the respective advantages of VSI and PSI measurements, hereby achieving the characteristic of high precision and limitless measurement range. In particular, the slope correction factor and the disp... | 09/09/2008 |
| 7277181 | Interferometric apparatus and method for surface profile detection An apparatus for detecting the surface profile of a test object includes a light source, a beam splitter, a reflective component, a sensor, and a computing device. The light source emits a light beam. The beam splitter divides the light beam into reference and probi... | 10/02/2007 |
