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...During the Civil War, the Confederacy established its own Patent Office which issued 266 patents, a third of which concerned implements of war.
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| Number | Title | Issue Date |
| 7283256 | Method and apparatus for measuring wafer thickness A system for non-contact measurement of thickness of a test object. A laser beam is split into two identical directly opposed input beams. A calibration object of known thickness causes beams to be reflected from sides of the test object. Each reflected beam passes ... | 10/16/2007 |
| 7280232 | Method and apparatus for measuring wafer thickness A system for non-contact measurement of thickness of an object. A laser beam is split into two identical input beams that are directly opposed. A calibration object of known thickness causes beams to be reflected from sides of the test object. Each reflected beam pa... | 10/09/2007 |
| 6342705 | System for locating and measuring an index mark on an edge of a wafer In a system for locating and measuring an index mark on an edge of a wafer, a wafer to be examined is positioned and centered on a chuck in a horizontal chuck position such that an index mark is oriented within first and second index mark orientation feat... | 01/29/2002 |
| 6157450 | Automated optical surface profile measurement system A fully automated surface profiling system having a loading chamber and an adjacent measurement chamber containing a phase differential laser optical scanning system and a five-axis positioner having a vacuum chuck for holding and orienting a wafer for su... | 12/05/2000 |
| 5986753 | Wafer holding and orienting fixture for optical profilometry An optical profilometer having a movable head for measurement of the profile of a surface of a wafer under test in response to an optical beam projected by the head and incident onto the surface. The wafer may be a substrate for a data storage disc, and t... | 11/16/1999 |
