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Assignee: Asylum Research Corporation


Location: Santa Barbara, CA
No. of patents: 16

NumberTitleIssue Date
8042383Digital Q control for enhanced measurement capability in cantilever-based instruments
A digital system for controlling the quality factor in a resonant device. The resonant device can be any mechanically driven resonant device, but more particularly can be a device that includes a cantilever within its system, such as an atomic force microscope. The ...
10/25/2011
7937991Fully digitally controller for cantilever-based instruments
A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to de...
05/10/2011
7856665Apparatus and method for scanning capacitance microscopy and spectroscopy
An apparatus and technique for measuring the electrical capacitance between a conducting tip of a scanning probe microscope and a sample surface is described. A high frequency digital vector network analyzer is connected to the probe tip of the cantilever of an atom...
12/21/2010
7685869Nanoindenter
A new type of indenter is described. This device combines certain sensing and structural elements of atomic force microscopy with a module designed for the use of indentation probes, conventional diamond and otherwise, as well as unconventional designs, to produce h...
03/30/2010
7603891Multiple frequency atomic force microscopy
An apparatus and technique for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs work is described. ...
10/20/2009
7434445Apparatus for determining cantilever parameters
Apparatus for determining physical properties of micromachined cantilevers used in cantilever-based instruments, including atomic force microscopes, molecular force probe instruments and chemical or biological sensing probes. The properties that may be so determined...
10/14/2008
7372254Linear force detecting element formed without ferromagnetic materials which produces a resolution in a range of microns or less
A force detecting element is used to move a moving coil that is formed without ferromagnetic materials and is driven using a stationary coil that is formed without ferromagnetic materials, thereby producing an output signal which is more linear than the previous tec...
05/13/2008
7271582Linear variable differential transformers for high precision position measurements
A linear variable transformer (LVDT) for use in a transducer. The LVDT has a non-ferromagnetic core which may eliminate Barkhausen noise and thereby improve the sensitivity of the resulting measurements. In one aspect, this system may be used in an atomic force micr...
09/18/2007
7266997Tactile force and/or position feedback for cantilever-based force measurement instruments
An apparatus for simulating a tactile interface with the relative position of the probe of a cantilever-based force measurement instrument, such as an atomic force microscope, molecular force probe or profilometer, or the force between the probe and a sample. The de...
09/11/2007
7262592Linear variable differential transformers for high precision position measurements
A linear variable differential transformer (LVDT) is disclosed that has first and second coil is formed of materials that minimize the Barkhausen noise, and hence which produces outputs that are substantially independent of any Barkhausen noise. In an embodiment, th...
08/28/2007
7234342Fully digital controller for cantilever-based instruments
A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to de...
06/26/2007
7233140Position sensing assembly with sychronizing capability
A linear variable transformer, or LVDT, for use with the transducer, which has a non-ferromagnetic core that can eliminate Barkhausen noise. By eliminating the Barkhausen noise, the sensitivity of the resulting measurements can be improved. The LVDT is formed of mul...
06/19/2007
7165445Digital control of quality factor in resonant systems including cantilever based instruments
A digital system for controlling the quality factor in a resonant device. The resonant device can be any mechanically driven resonant device, but more particularly can be a device that includes a cantilever within its system, such as an atomic force microscope. The ...
01/23/2007
7084384Diffractive optical position detector in an atomic force microscope having a moveable cantilever
An apparatus and method for measuring optically the position or angle of a variety of objects or arrays of objects, including cantilevers in scanning probe microscopy, micromechanical biological and chemical sensors and the sample or a probe in surface profilometry....
08/01/2006
7066005Noncontact sensitivity and compliance calibration method for cantilever-based insturments
A method for determining physical properties of micromachined cantilevers used in cantilever-based instruments, including atomic force microscopes, molecular force probe instruments and chemical or biological sensing probes. The properties that may be so determined ...
06/27/2006
7038443Linear variable differential transformers for high precision position measurements
A linear variable transformer (LVDT) for use in a transducer. The LVDT has a non-ferromagnetic core which may eliminate Barkhausen noise and thereby improve the sensitivity of the resulting measurements. In one aspect, this system may be used in an atomic force micr...
05/02/2006
 
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