Celebrity Inventors
Mark Twain (Samuel L. Clemens) received Patent No. 121,992 for "An Improvement in Adjustable and Detachable Straps for Garments." He later received two more patents: one for a self-pasting scrapbook and one for a game to help players remember important historical dates.
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| Number | Title | Issue Date |
| 8185339 | Test method and program product used therefor The testing method of the present invention for testing a plurality of devices under test connected to a test module includes (a) determining combinations of devices under test that can theoretically be measured simultaneously from among the combinations of the plur... | 05/22/2012 |
| 8185336 | Test apparatus, test method, program, and recording medium reducing the influence of variations Provided is a test apparatus that tests a device under test, including a vector expanding section that sequentially generates a plurality of test vectors; a predicting section that calculates a predicted value for each test vector by simulating an operation of the d... | 05/22/2012 |
| 8185328 | Device, method, and program for measuring signal, and recording medium Differences in outputs from multiple terminals are easily measured. There is provided a signal measuring device for receiving signals to be measured which are generated by modulating frequency-different signals different in frequency from each other, and are respect... | 05/22/2012 |
| 8183951 | Modulator It is possible to restrain distortions generated in a mixer. A modulator includes a local signal source that generates an in-phase local signal, a multiplier that multiplies an in-phase baseband signal (I) and the in-phase local signal by each other, a phase inverte... | 05/22/2012 |
| 8183893 | Driver comparator circuit A first resistor is arranged such that a first voltage is applied to a first terminal thereof, and a second terminal thereof is connected to an input/output terminal. The first voltage is applied to a first terminal of a second resistor. A tail current source genera... | 05/22/2012 |
| 8183528 | Electromagnetic wave measuring apparatus, measurement method, a program, and a recording medium According to the present invention, the CT is carried out based on parameters other than the absorption rate. An electromagnetic wave measurement device includes an electromagnetic wave output device 2 which outputs an electromagnetic wave at a frequency equa... | 05/22/2012 |
| 8179154 | Device, test apparatus and test method Provided is a test apparatus that tests a device under test. The device under test includes: a circuit under test; and a switching section that that connects an internal terminal being tested, from among one or more internal terminals of the circuit under test, to e... | 05/15/2012 |
| 8179123 | Measurement apparatus and recording medium Provided is a measurement apparatus that measures power of a modulated signal that is modulated with a carrier signal having a prescribed frequency, comprising an AD converting section that outputs a digital modulated signal obtained by AD converting the modulated s... | 05/15/2012 |
| 8175828 | Evaluation apparatus, evaluation method, program, recording medium and electronic device Provided is an evaluation apparatus that evaluates a characteristic of a propagation apparatus propagating a signal, comprising an output signal measuring section that measures a probability density function expressing a probability density distribution of jitter of... | 05/08/2012 |
| 8170071 | Laser apparatus Provided is a laser apparatus including: a DFB fiber laser 40 including, as an amplitude medium, a rare earth doped silica optical fiber codoped with a high concentration of aluminum; an optical feedback path 50 formed by a ring-shaped optical fiber; a... | 05/01/2012 |
| 8165836 | Measurement apparatus and computer readable medium storing program for measuring error of a quadrature demodulator or quadrature modulator A measurement apparatus that measures, as an error under measurement, at least one of a gain error and a phase error of a quadrature demodulator or a quadrature modulator as a measurement target. The measurement apparatus includes an output control section that caus... | 04/24/2012 |
| 8165027 | Test apparatus and test method There is provided a test apparatus for testing at least one device under test, including a packet list storing section that stores a plurality of packet lists each of which includes a series of packets communicated between the test apparatus and the at least one dev... | 04/24/2012 |
| 8164394 | Modulation apparatus and test apparatus Provided is a modulation apparatus that outputs an output signal having a designated amplitude and a designated phase, comprising a first variable delay section that outputs a first delayed signal obtained by delaying a periodic signal by a set delay time; a second ... | 04/24/2012 |
| 8164355 | Electronic component pressing device and electronic component test apparatus An electronic component pressing device includes a first pressing member for pressing a predetermined first region of the electronic component to be tested; a second pressing member for pressing a predetermined second region other than the first region of the electr... | 04/24/2012 |
| 8164351 | Test apparatus Provided is a test apparatus that tests a device under test, including a power supply that generates supply power supplied to the device under test, a transmission path that transmits the supply power generated by the power supply to the device under test, an interm... | 04/24/2012 |
| 8164322 | Phase-difference-corresponding-value measurement device, gain imbalance measurement device, method, program, and recording medium A modulation error measurement device according to the present invention receives a demodulated signal containing a demodulated I signal and a demodulated Q signal from a quadrature demodulator receiving an RF signal output by a quadrature modulator and applying the... | 04/24/2012 |
| 8159290 | Test apparatus, demodulation apparatus, test method, demodulation method and electric device Provided is a test apparatus for testing a device under test that outputs, as an output signal, an amplitude-phase modulated signal having a level and a transition point phase selected from among a plurality of levels and a plurality of phases according to transmiss... | 04/17/2012 |
| 8155897 | Test apparatus, transmission system, program, and recording medium Provided is a semiconductor test apparatus that tests a device under test, comprising a test unit that tests a device under test; and a serial transmitting section that transmits transmission data back and forth between the test unit and a control section controllin... | 04/10/2012 |
| 8155215 | Transmission system, transmitter, receiver, and transmission method There is provided a circuit constituted by small-sized and simple logical gates which reduces the bit errors generated in a data sequence received by a receiver. A transmission system, in which a data sequence is transferred, includes a transmitter that transmits a ... | 04/10/2012 |
| 8150648 | Timing generator A delay setting data generator generates delay setting data based on rate data. A variable delay circuit delays the test pattern data by a delay time determined by the delay setting data with reference to a predefined unit amount of delay. First rate data designates... | 04/03/2012 |
| 8150647 | Electric device and diagnostic apparatus An electric device includes a plurality of circuits that operate in synchronization with a clock signal, a plurality of flip-flops each of which acquires a data value of a signal from a corresponding one of the plurality of circuits in synchronization with the clock... | 04/03/2012 |
| 8149721 | Test apparatus and test method There is provided a test apparatus for testing a device under test, including an obtaining section that obtains a packet sequence communicated between the test apparatus and the device under test, from a simulation environment for simulating an operation of the devi... | 04/03/2012 |
| 8145965 | Test apparatus for testing a device under test and device for receiving a signal A test apparatus for testing a device under test includes a capture memory that stores thereon an output pattern received from the device under test, a header detecting section that reads the output pattern from the capture memory and detects a portion matching a pr... | 03/27/2012 |
| 8140290 | Transmission characteristics measurement apparatus, transmission characteristics measurement method, and electronic device Provided is a transfer characteristic measurement apparatus that measures a transfer characteristic of a circuit under test between input and output, comprising a test signal input section that generates a test signal by adding together a carrier signal having a pre... | 03/20/2012 |
| 8139953 | Signal transmission device, signal reception device, test module, and semiconductor chip There is provided a signal transmission device which transmits, in the form of an optical signal, multivalued data which shifts through three or more plurality of logical values, and includes: a light emitting element which outputs light having an intensity correspo... | 03/20/2012 |
| 8134381 | Connection board, probe card, and electronic device test apparatus comprising same A probe card is provided which includes: probe needles electrically contacting input/output terminals of an IC device formed on a semiconductor wafer W; a mount base on which the probe needles are mounted; a support column supporting the mount base, a circuit board ... | 03/13/2012 |
| 8134379 | Probe wafer, probe device, and testing system A probe wafer electrically connected to a semiconductor wafer on which a plurality of semiconductor chips are formed includes: a wafer substrate for pitch conversion including a wafer connection surface and an apparatus connection surface opposing the wafer connecti... | 03/13/2012 |
| 8132161 | Semiconductor test program debug device It is possible to provide a semiconductor test program debug device capable of reducing the unnecessary facilities when using a semiconductor test device or a semiconductor test program of different specification. The semiconductor test program debug device 300 | 03/06/2012 |
| 8129857 | Semiconductor circuit A first signal processing circuit performs predetermined signal processing on a first signal to provide a change to a characteristic value thereof, and then outputs a second signal. A second signal processing circuit performs predetermined signal processing on the s... | 03/06/2012 |
| 8121815 | Noise separating apparatus, noise separating method, probability density function separating apparatus, probability density function separating method, testing apparatus, electronic device, program, and recording medium There is provided a noise separating apparatus that separates a probability density function of a predetermined noise component from a probability density function of a signal under test. The noise separating apparatus includes a domain transforming section that is ... | 02/21/2012 |
| 8117004 | Testing module, testing apparatus and testing method To increase the overall efficiency of a test apparatus, provided is a test module that includes an instruction information storage section that stores instruction information indicating an order in which basic patterns are expanded; a basic pattern data storage sect... | 02/14/2012 |
| 8111082 | Test apparatus A test apparatus is configured such that two adjacent channels form a pair. Timing comparators determine the level of first output data fed from a DUT, respectively, timed in accordance with strobe signals, respectively. Clock envelope extractors extract envelopes o... | 02/07/2012 |
| 8097475 | Method of production of a contact structure A probe card having a plurality of silicon finger contactors contacting pads provided on a tested semiconductor wafer and a probe board mounting the plurality of silicon finger contactors on its surface, wherein each silicon finger contactor has a base part on which... | 01/17/2012 |
| 8094566 | Test apparatus and test method Provided is a test apparatus that tests a device under test, comprising a test module section that tests the device under test; a test control section that generates control packets for controlling the test module section; and a connecting section that receives the ... | 01/10/2012 |
| 8094053 | Signal generating apparatus and test apparatus Provided is a signal generating apparatus comprising a DA converter that outputs an output signal corresponding to input data supplied thereto; a sample/hold unit that is provided between the DA converter and an output end of the signal generating apparatus, and tha... | 01/10/2012 |
| 8093918 | Electronic device identifying method and electronic device comprising identification means An electronic device that includes an actual operation circuit that operates during an actual operation of the electronic device, a second test circuit and a third test circuit that operate during a test of the electronic device, and a power supply section. The powe... | 01/10/2012 |
| 8093907 | Test equipment A test apparatus for a DUT having a bidirectional differential interface is provided. A main driver amplifier generates a first differential signal Vd based on pattern data (PAT) to be transmitted to a DUT. A first replica driver amplifier generates a second ... | 01/10/2012 |
| 8090011 | Measuring apparatus, measuring method, recording medium, and test apparatus Provided is a measuring apparatus which measures a quadrature modulator, including a supplying section supplying the quadrature modulator with a reference I signal having a predetermined frequency and a reference Q signal whose phase is shifted by 90 degrees from th... | 01/03/2012 |
| 8090009 | Test apparatus A test apparatus includes a transmitting-side jitter measuring unit which measures a jitter of a transmission signal output from a transmitting circuit, a jitter applying unit which applies a jitter to the transmission signal and inputs the signal to a receiving cir... | 01/03/2012 |
| 8082118 | Test apparatus Provided is a test apparatus that tests a device under test, comprising a clock recovering section that recovers a clock signal from an output signal output by the device under test; an acquiring section that acquires the output signal at a timing corresponding to t... | 12/20/2011 |
