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| Number | Title | Issue Date |
| 7430486 | Datalog support in a modular test system A method for communicating test information from a source to a destination is disclosed. The method includes providing a modular test system, where the modular test system comprises a system controller for controlling at least one site controller, the at least one s... | 09/30/2008 |
| 7210087 | Method and system for simulating a modular test system A method for simulating a modular test system is disclosed. The method includes providing a controller, where the controller controls at least one vendor module and its corresponding device under test (DUT) model, creating a simulation framework for establishing sta... | 04/24/2007 |
| 7209851 | Method and structure to develop a test program for semiconductor integrated circuits A method for managing a pattern object file in a modular test system is disclosed. The method includes providing a modular test system, where the modular test system comprises a system controller for controlling at least one site controller, and where the at least o... | 04/24/2007 |
| 7197417 | Method and structure to develop a test program for semiconductor integrated circuits A method for developing a test program for a semiconductor test system is disclosed. The method includes describing a test plan file in a test program language (TPL), where the test plan file describes at least one test of the test program, describing a test class f... | 03/27/2007 |
| 7197416 | Supporting calibration and diagnostics in an open architecture test system A method for integrating test modules in a modular test system includes creating component categories for integrating vendor-supplied test modules and creating a calibration and diagnostics (C&D) framework for establishing a standard interface between the vendor-sup... | 03/27/2007 |
| 7184917 | Method and system for controlling interchangeable components in a modular test system A method for integrating test modules in a modular test system is disclosed. The method includes controlling at least one test module and its corresponding device under test (DUT) with a controller, establishing a standard module control interface between a vendor-s... | 02/27/2007 |
