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Pet Toilet-Like Water Disk and Food Storage
One pet-friendly inventor patented "a device for watering pets, e.g., a dog or cat." The device, he helpfully noted, "has the general shape of a toilet."
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| Number | Title | Issue Date |
| 7302360 | Defect size projection A system and method of inspecting semiconductor wafers that is capable of determining a scattering power associated with a wafer surface defect whether or not the scattering power associated with the defect exceeds the dynamic range of the system. The scattering pow... | 11/27/2007 |
| 7280200 | Detection of a wafer edge using collimated light A system and method of inspecting a semiconductor wafer that may be employed to detect and to characterize defects occurring on an edge of the wafer. The wafer inspection system includes an optical module for providing a light source to scan the wafer edge, a light ... | 10/09/2007 |
| 7184928 | Extended defect sizing A system for inspecting semiconductor wafers capable of determining a scattering power associated with a wafer surface detect whether or not the scattering power exceeds the dynamic range of the system. The scattering power is obtained by determining the height of a... | 02/27/2007 |
| 7175214 | Wafer gripping fingers to minimize distortion An apparatus for measuring semiconductor wafer shape that minimizes wafer distortion. The apparatus includes a plurality of wafer gripping fingers for holding a wafer in a predetermined position during wafer measurement. Each finger includes a groove that contacts t... | 02/13/2007 |
| 7136519 | Specimen topography reconstruction This method removes high frequency noise from shape data, significantly improves metrology system (10) performance and provides very compact representation of the shape. This model-based method for wafer shape reconstruction from data measured by a dimensiona... | 11/14/2006 |
| 7114399 | Shaped non-contact capacitive displacement sensors for measuring shaped targets An improved non-contact capacitive displacement sensor that may be employed for accurately measuring small distances between the sensor and shaped targets. The non-contact capacitive displacement sensor includes a probe having a sensor element and a guard element. T... | 10/03/2006 |
| 6954269 | Ring chuck to hold 200 and 300 mm wafer A ring chuck that holds a wafer with a vacuum uses a vacuum trough that contacts the entire outer edge of the wafer. The chuck has a base having a top surface equal to or slightly smaller than a water to be tested with vacuum channels in the base. The base provides ... | 10/11/2005 |
| 6760100 | Method and apparatus for classifying defects occurring at or near a surface of a smooth substrate In an optical inspection system, defects such as particles, pits, subsurface voids, mounds, or other defects occurring at or near the smooth surface of a substrate are classified by type and size based on the magnitude S of a signal produced by collected light for e... | 07/06/2004 |
| 6621581 | Method and apparatus for mapping surface topography of a substrate Full surface maps of slope and height are determined for the surface of a highly smooth surface such as a silicon wafer, by an apparatus which includes a light source for creating a light beam and scanning and wafer transport systems which cause the incid... | 09/16/2003 |
| 6594002 | Wafer shape accuracy using symmetric and asymmetric instrument error signatures A method to determine the systematic error of an instrument that measures features of a semiconductor wafer includes the following sequential steps. Collecting sensor data from measurement runs on front and back surfaces of a wafer while the wafer is orie... | 07/15/2003 |
| 6560555 | Method for facilitating the field replacement of sensors A method for facilitating field replacement of sensors is presented. The replacement sensor's transfer function need only be measured, not adjusted, and the signal-processing unit's transfer function need only be adjusted, but not measured, to achieve sim... | 05/06/2003 |
| 6556941 | Separation of periodic and non-periodic signal components A process for obtaining the periodic component in a data vector of data taken of a sensed property of an element driven by one or more rotary components over several rotations. The procedure comprises first forming the data vector asynchronously with resp... | 04/29/2003 |
| 6538733 | Ring chuck to hold 200 and 300 mm wafer A ring chuck that holds a wafer with a vacuum uses a vacuum trough that contacts the entire outer edge of the wafer. The chuck has a base having a top surface equal to or slightly smaller than a wafer to be tested with vacuum channels in the base. The bas... | 03/25/2003 |
| 6501269 | Vector kerr magnetometry A system and method for realizing vector Kerr magnetometry are disclosed. The system enables simultaneous longitudinal and transverse Kerr effect measurements at each point on a sample surface. An optional component includes a sample platform for achievin... | 12/31/2002 |
| 6491330 | Edge gripping end effector wafer handling apparatus An edge-gripping wafer handling apparatus for holding and transporting wafers in a clean room environment is implemented by mounting gripping fingers on a paddle arm adapted to be controlled by a robot. At the free end of the paddle arm, a plurality of fi... | 12/10/2002 |
| 6486946 | Method for discriminating between holes in and particles on a film covering a substrate P-polarized light or having a strong P-polarized component is directed onto a filmed substrate at two (or more) different incidence angles, one angle being relatively large and the other angle being relatively small as measured from a surface normal. Ligh... | 11/26/2002 |
| 6476621 | Self-bootstrapping transducer interface A mechanism to provider a bootstrapped power source for a differential operational amplifier includes a three-winding transformer having a first winding disposed between a positive voltage and a plus power input to the amplifier, yielding an initial plus ... | 11/05/2002 |
| 6400162 | Capacitive displacement sensor for measuring thin targets A capacitive displacement sensor for measuring thin targets is presented. The plate of the measurement probe is designed to take into account the thin target shape and to provide accurate measurements of the thin target by reducing lateral movement sensit... | 06/04/2002 |
| 6260899 | Centrifugal gripper mechanism for dynamic force compensation A force compensating apparatus is for use in a wafer-handling machine. The wafer-handling machine includes a rotatable rim adapted to be concentric with and external to a wafer, and a plurality of wafer-supporting fingers disposed about the rim. Each fing... | 07/17/2001 |
| 6255664 | Sensor for measuring degree of flatness A sub sensor for measuring a small area is integrally incorporated in a main sensor for measuring a large area and a part in the vicinity of the edge of a wafer is measured by the sub sensor, while a center of a wafer is measured by the main sensor.... | 07/03/2001 |
| 6181142 | Nonlinear current mirror for loop-gain control A nonlinear current mirror for loop-gain control incorporates a resistor in one section of a current mirror which produces a nonlinear transfer function for the current mirror. When the nonlinear current mirror is included as part of a capacitive displace... | 01/30/2001 |
| 5750908 | Testing system with real time/off line functionality allocation A testing system with real time/off line functionality allocation is disclosed. The real time functions are limited to movement of objects to be tested through the testing stations, operation of sensors to gather raw data, and storage of the raw data. The... | 05/12/1998 |
