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| Number | Title | Issue Date |
| 7784107 | High speed measurement, analysis and imaging systems and methods for length scales from meter to sub-nanometer An system for the measurement, analysis, and imaging of objects and surfaces in a variety of sizes is provided. In the most general terms, the invention relates to a device capable of measuring an object using a combination of low-resolution optical, high-resolution... | 08/24/2010 |
| 4782327 | Computer control A computer control includes a control member movably mounted for movement in two dimensions wherein orthogonally related gratings are moved to the corresponding directions to generate pairs of quadrature related signals. Circuitry produces binary signals ... | 11/01/1988 |
