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| Application No. | Application Title | Issue Date |
| 20120126843 | PROBE CARD HOLDING APPARATUS AND PROBER A probe card holding apparatus which is provided at a prober and holds a probe card includes: a clamp mechanism which clamps a clamp head which is formed at the probe card; a clamp bar which is laid over an opening of the prober in which the probe card is inserted; and ... | 05/24/2012 |
| 20120109548 | MEASUREMENT APPARATUS, MEASUREMENT METHOD AND RECORDING MEDIUM A measurement apparatus for measuring a characteristic (for example, EVM) of a device under measurement provided with a quadrature modulator or a quadrature demodulator is provided. The measurement apparatus includes an I-Q error measuring section that measures a freque... | 05/03/2012 |
| 20120081129 | TEST APPARATUS Delay circuits apply a delay to set and reset pulses, respectively. An RS flip-flop is set according to the set pulse that has passed through the set delay circuit, and is reset according to the reset pulse received from the reset delay circuit. A demultiplexer receives... | 04/05/2012 |
| 20120068548 | WIRELESS POWER SUPPLY APPARATUS A wireless power supply apparatus transmits an electric power signal including any one of an electric field, a magnetic field, and an electromagnetic field. A bridge circuit includes multiple switches. A control unit performs switching control of the multiple switches o... | 03/22/2012 |
| 20120049893 | POWER SUPPLY APPARATUS FOR TEST APPARATUS A voltage source generates a power supply voltage VOUT stabilized such that it matches the voltage level that corresponds to a reference voltage VREF, and supplies the power supply voltage to a DUT. A current detection circuit generates a detection... | 03/01/2012 |
| 20120049876 | TEST-USE INDIVIDUAL SUBSTRATE, PROBE, AND SEMICONDUCTOR WAFER TESTING APPARATUS [Problems to be solved] To provide a test-use individual substrate capable of improving testing accuracy and connecting reliability. [Means for solving the Problems] A test-use individual substrate 30 which is used for testing a semi... | 03/01/2012 |
| 20120043968 | VARIABLE EQUALIZER CIRCUIT A variable equalizer circuit equalizes a signal received via a transmission line from a device which is a communication partner device. A first resistor is arranged between an output terminal and a fixed voltage terminal, and is configured to have a variable resistance.... | 02/23/2012 |
| 20120038382 | PROBE AND METHOD OF MANUFACTURING SAME A probe includes a plurality of boards each of which has a plurality of magnets, a plurality of the boards include a first board and a second board laid on the first board, a plurality of the magnets include a plurality of first magnets provided with the first board and... | 02/16/2012 |
| 20120036404 | CONTROL APPARATUS AND CONTROL METHOD A control apparatus controlling testing of a memory under test that includes one or more row repair memory blocks and column repair memory blocks. The control apparatus comprises a counting section that sequentially receives test results respectively indicating pass/fai... | 02/09/2012 |
| 20120033208 | DEVICE INTERFACE APPARATUS AND TEST APPARATUS It is an object of the present invention to test a device under test including an optical interface. Provided is a device interface apparatus on which is loaded a device under test including an optical interface. The device interface apparatus comprises a device loading... | 02/09/2012 |
| 20120025858 | PROBE CARD HOLDING APPARATUS A probe card holding apparatus is provided and may be configured to hold a probe card in a test head. The probe card may include a clamp head formed at a center part of a back surface of the probe card, and a holding device provided at the test head and configured to en... | 02/02/2012 |
| 20110283153 | TEST APPARATUS, TEST MODULE AND TEST METHOD A test module comprising a compression information storage section that stores a plurality of pieces of compression information that each associate a pattern sequence with a piece of pattern sequence identification information; a basic pattern storage section that store... | 11/17/2011 |
| 20110282617 | TEST APPARATUS, TEST METHOD AND SYSTEM A test apparatus for testing a device under test includes a control apparatus, a plurality of test modules, and a plurality of relay apparatuses that connect the control apparatus and the plurality of test modules, each relay apparatus including (1) an upper port sectio... | 11/17/2011 |
| 20110282616 | TEST APPARATUS AND TEST METHOD Provided is a test apparatus that tests a device under test, comprising a control apparatus that controls testing of the device under test; a test unit that sends and receives signals to and from the device under test; and a buffer section that buffers access requests t... | 11/17/2011 |
| 20110282615 | TEST MODULE, TEST APPARATUS AND TEST METHOD A test module comprising a compression information storage section that stores compression information associating pattern sequences, pattern sequence identification information, and repetition information with each other; a basic pattern storage section that stores, as... | 11/17/2011 |
| 20110279812 | TEST APPARATUS, TEST METHOD, AND DEVICE INTERFACE Provided is a test apparatus that tests a device under test including an optical coupler transmitting optical signals in a direction perpendicular to a device surface. The test apparatus comprises a substrate on which the device under test is to be loaded; an optical tr... | 11/17/2011 |
| 20110279811 | TEST APPARATUS, TEST METHOD, AND DEVICE INTERFACE Provided is a test apparatus that tests a device under test including an optical coupler for transmitting optical signals in a surface direction and a first groove for holding an optical transmission path connected to the optical coupler. The test apparatus comprises a ... | 11/17/2011 |
| 20110279140 | Connector And Semiconductor Testing Device Having The Same To provide a connector wherein ground terminals can be designed easily, which not only suppresses the occurrence of impedance mismatch and crosstalk, but which does not lead to interferences between contacting portions. A ground terminal for a connector has a cylindrica... | 11/17/2011 |
| 20110279109 | TEST APPARATUS AND TEST METHOD There is provided a test apparatus for testing a device under test, including a test signal generator that generates a test signal to test the device under test, an electric-photo converter that converts the test signal into an optical test signal, an optical interface ... | 11/17/2011 |
| 20120019272 | PIN CARD AND TEST APPARATUS USING THE SAME A DUT is connected to an I/O terminal. An AC test unit performs an AC test operation for the DUT. A DC test unit performs a DC test operation for the DUT. An optical semiconductor switch is arranged such that a first terminal thereof is connected to the AC test unit and... | 01/26/2012 |
| 20110277293 | CARRIER DISASSEMBLING APPARATUS AND CARRIER DISASSEMBLING METHOD A carrier disassembling apparatus 1, which disassembles a carrier for test 60, comprises a holding head 11 that holds a cover member 80, a holding table 20 that holds a base member 70, and a first carrier arm 16 that caus... | 11/17/2011 |
| 20110276830 | TEST MODULE AND TEST METHOD There is provided a test module comprising a random number generator that generates a pseudo random pattern and includes a controller that generates a register selection signal based on a control instruction stored on an instruction memory, a plurality of polynomial con... | 11/10/2011 |
| 20110274127 | PULSE LASER, OPTICAL FREQUENCY STABILIZED LASER, MEASUREMENT METHOD, AND MEASUREMENT APPARATUS The object is to measure the carrier envelope offset frequency of a mode-locked laser. Provided is a pulse laser that measures a carrier envelope offset frequency of a mode-locked laser, pulse laser comprising a mode-locked laser that generates an optical pulse; a band ... | 11/10/2011 |
| 20110271774 | TEST CARRIER [Problem] A test carrier able to secure a high air-tightness is provided. [Solution] A test carrier 10 comprises a cover member 50A and a base member 20A which are bonded together while sandwiching a die 90 betwe... | 11/10/2011 |
| 20110260745 | CONNECTOR ATTACHING/DETACHING APPARATUS AND TEST HEAD The connector attaching/detaching apparatus includes a plurality of fitting members that causes connectors to fit with or separate from one another by sliding, guiding members that sequentially causes the plurality of fitting members to slide by moving in an arrangement... | 10/27/2011 |
| 20120013343 | RECEIVING APPARATUS, TEST APPARATUS, RECEIVING METHOD, AND TEST METHOD A receiving apparatus that acquires a reception signal using a recovered clock that is recovered from an edge of the reception signal. The receiving apparatus comprises a recovered clock generating section that generates the recovered clock; a multi-strobe generating se... | 01/19/2012 |
| 20120010857 | METHOD AND APPARATUS FOR COMPLEX TIME MEASUREMENTS Apparatus used in an automatic test equipment, comprising a plurality of system modules. Each system module comprises a Time Measurement Unit. The Time Measurement Unit comprises a Global Time Stamping Module. The Global Time Stamping Module comprises a plurality of Glo... | 01/12/2012 |
| 20120007574 | SWITCHING CIRCUIT AND TEST APPARATUS Provided is a switching circuit with high withstand voltage. The switching circuit switches whether two terminals are electrically connected to each other, according to a switching signal input thereto. The switching circuit comprises a first switching section that swit... | 01/12/2012 |
| 20110316645 | STEP ATTENUATOR APPARATUS A step attenuator apparatus is provided, having an attenuation ratio which is switchable according to a control signal. Multiple variable attenuators are connected in series. Each variable attenuator includes a first terminal, a second terminal, multiple paths having di... | 12/29/2011 |
| 20110316575 | PIN ELECTRONICS CIRCUIT An I/O pin is connected to a DUT via a transmission line. A driver generates a test signal to be supplied to the DUT. A driver-side switch and an output resistor are arranged in series between the driver and the I/O pin. A comparator is arranged such that the input term... | 12/29/2011 |
| 20110316571 | SEMICONDUCTOR WAFER TEST APPARATUS An apparatus includes a plurality of test heads to which probe cards are electrically connected; a wafer tray which is able to hold a semiconductor wafer; and an alignment apparatus which positions the semiconductor wafer held on the wafer tray relatively with respect t... | 12/29/2011 |
| 20110316557 | TEST APPARATUS AND TEST METHOD A test apparatus that tests a device under test, comprising a signal output section that outputs a test signal for testing the device under test; a signal acquiring section that acquires a device signal output by the device under test; and an adjusting section that adju... | 12/29/2011 |
| 20110316554 | SWITCHING APPARATUS AND TEST APPARATUS To perform a forcible disconnection when voltage outside a reference range is applied to a terminal, provided is a switching apparatus comprising a main switch provided between a first terminal and a second terminal; a voltage detection section that detects whether volt... | 12/29/2011 |
| 20110316347 | WIRELESS POWER RECEIVING APPARATUS A wireless power receiving apparatus receives an electric power signal including any one of an electric field, magnetic field, or electromagnetic field, transmitted from a wireless power supply apparatus. A resonance capacitor is arranged together with a reception coil ... | 12/29/2011 |
| 20110309960 | POWER SUPPLY APPARATUS FOR TEST APPARATUS A power supply apparatus is provided for a test apparatus configured to supply a power supply signal to a DUT. An A/D converter performs analog/digital conversion of an analog observed value that corresponds to a power supply signal so as to generate a digital observed ... | 12/22/2011 |
| 20110309427 | SWITCHING DEVICE AND TESTING APPARATUS There is provided a switching device that electrically connects or disconnects a first terminal and a second terminal to/from each other. The switching device includes a semiconductor layer, a drain electrode that is formed in the semiconductor layer, where the drain el... | 12/22/2011 |
| 20110298630 | TEST APPARATUS AND TEST METHOD A test apparatus comprising a plurality of test units that test a device under test; a plurality of housing sections that respectively house the test units therein; a plurality of opening/closing sections that are disposed respectively in the housing sections and that e... | 12/08/2011 |
| 20110298557 | MODULATION APPARATUS, PHASE SETTING METHOD AND TEST APPARATUS A modulation apparatus comprising a first modulating section that outputs a first modulated signal having a fixed amplitude and a set phase; a second modulating section that outputs a second modulated signal having the fixed amplitude and a set phase; an adding section ... | 12/08/2011 |
| 20110298522 | OUTPUT APPARATUS AND TEST APPARATUS Provided is an output apparatus that outputs an output signal corresponding to an input signal, comprising a plurality of drivers that each output an intermediate signal having a waveform corresponding to the input signal; an adding section that adds together the interm... | 12/08/2011 |
| 20110291682 | PIN CARD AND TEST APPARATUS USING THE SAME A first switch is arranged such that a first terminal thereof is connected to an AC test unit and a second terminal thereof is connected to an I/O terminal and a DC test unit. A first switch is configured so as to be capable of switching states between a connection stat... | 12/01/2011 |
