Inventors
AssigneeUS Classes355/30, With temperature or foreign particle control137/596, Supply and exhaust355/53, Step and repeat355/77MethodsAttorney, Agent or FirmInternational ClassesG03B 27/42F17D 1/00 G03B 27/52 Abstract textA fluid handling structure is disclosed which is designed for all wet immersion lithography. The fluid handling structure has a first opening to provide fluid to a space between a final element of a projection system and a substrate and/or substrate table, a barrier to resist the flow of liquid out of the space between the fluid handling structure and the substrate, and a second opening, which opens into an area radially outwardly of the space, to provide a flow of fluid from the fluid handling structure onto a top surface of the substrate and/or substrate table radially outwardly of the space. A controller may be provided such that flow of fluid towards a center of the substrate table is greater than the flow of fluid in a direction away from the center of the substrate table. |
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