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US Patent Application 20100012490 - TEST STRIP WITH OPTICAL IDENTIFICATION PATTERNS AND TEST INSTRUMENT USING THE SAME

Application 20100012490 Filed on July 15, 2008. Published on January 21, 2010

Inventor

US Classes

204/400, Analysis and testing422/82.05, Measuring optical property by using ultraviolet, infrared, or visible light422/55Structured visual or optical indicator, per se

Attorney, Agent or Firm

International Classes

G01N 27/26
G01N 21/01
G01N 21/78


Abstract text


The present invention discloses a test strip with optical identification patterns and a test instrument using the same characterized in that the test strip incorporates an identification area. Different combinations of optical identification patterns on the identification area create different digital identification signals. After the test strip is inserted into the test instrument, the test instrument will obtain the digital identification signal and learn the test code, analysis parameters, expiry date and batch number of the test strip. Thereby, the test instrument can verify the batch number and expiry date of the test strip, perform calibration according to the analysis parameters, and provide a correct test result. The present invention can provide many sets of digital identification signals to differentiate test strips. Therefore, the present invention can be operated fast, conveniently and correctly and can prevent a user from forgetting to calibrate the test instrument.

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