InventorsAssigneeUS Classes700/108, Performance monitoring700/121Integrated circuit production or semiconductor fabricationAttorney, Agent or FirmForeign Documents- 10 2005 009 022.2 DE 02/28/2005
International Class G06F 19/00 Issued Patent Number:7783372
Abstract textAn automated throughput control system and method is provided. By gathering tool specific information of a plurality of process tools on entity level, appropriate throughput related performance characteristics may be calculated with high statistical significance during moderately short time intervals. Moreover, the performance characteristics obtained from tool information may be compared to reference data, for instance provided by dynamic simulation calculations, to identify high, as well as low, performing equipment on the basis of standard process control mechanisms. |