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US Patent Application 20080132095 - METHOD OF MAKING A SOCKET TO PERFORM TESTING ON INTEGRATED CIRCUITS AND SOCKET MADE

Application 20080132095 Filed on February 12, 2008. Published on June 5, 2008

Inventors

Assignee

US Classes

439/73, With external, contact enhancing clamp29/825, Conductor or circuit manufacturing324/754, With probe elements439/331Movement-actuating or retaining means comprises cover press

Attorney, Agent or Firm

International Classes

H01R 43/00
H01R 12/00


Abstract text


A interconnect structure is inexpensively manufactured and easily insertable into a socket. The interconnect structure is manufactured by forming a sacrificial substrate with cavities that is covered by a masking material having openings corresponding to the cavities. A first plating process is performed by depositing conductive material, followed by coupling wires within the openings and performing another plating process by depositing more conductive material. The interconnect structure is completed by first removing the masking material and sacrificial substrate. Ends of the wires are coupled opposite now-formed contact structures to a board. To complete the socket, a support device is coupled to the board to hold a tested integrated circuit.

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