Abstract text

Detecting statuses of driving units of an active-matrix organic light emitting diode (AMOLED) may reveal defects in the manufacturing process. This helps to detect and remove defective elements earlier in the manufacturing process before forming luminous layers in an AMOLED so as to decrease loss of organic materials and manufacturing time, and to increase yield significantly in the later part of the manufacturing process. The tested AMOLED includes a plurality of voltage sources, a plurality of pixel electrodes, and a plurality of driving units corresponding to the pixel electrodes respectively. Each driving unit includes a first TFT, a second TFT, and a storage capacitor. Defective elements of each driving unit can be detected by checking the detection results.